Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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09935172
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Filing Dt:
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08/23/2001
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Publication #:
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Pub Dt:
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08/15/2002
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Inventors:
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Heiji Kobayashi, Shinya Nakatani
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Title:
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Test system and test method of semiconductor device
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 2-3, MARUNOUCHI 2-CHOME CHIYODA-KU |
| TOKYO 100-8310, JAPAN |
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| 4-1, MIZUHARA ITAMI-SHI |
| HYOGO 664-0005, JAPAN |
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| MCDERMOTT, WILL & EMERY |
| STEPHEN A. BECKER |
| 600 13TH STREET, N.W. |
| WASHINGTON, D.C. 20005 |
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