Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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09789543
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Filing Dt:
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02/22/2001
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Publication #:
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Pub Dt:
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09/05/2002
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Inventors:
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Shinichi Murakawa, Takashi Doi, Yoshio Egashira, Shigeo Ueda
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Title:
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Apparatus and method for testing electrode structure for thin display device using FET function
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 5-1, MARUNOUCHI 2-CHOME, CHIYODA-KU |
| TOKYO, JAPAN |
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| OBLON SPIVAK MCCLELLAND MAIER & NEUSTADT |
| MARVIN J. SPIVAK |
| FOURTH FLOOR |
| 1755 JEFFERSON DAVIS HIGHWAY |
| ARLINGTON , VA 22202 |
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