Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/23/2003
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Application #:
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10090957
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Filing Dt:
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03/05/2002
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Publication #:
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Pub Dt:
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09/12/2002
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Inventors:
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Michinobu Tanioka, Takahiro Kimura
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Title:
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PROBE FOR INSPECTING SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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7-1, SHIBA 5-CHOME, MINATO-KU |
TOKYO, JAPAN |
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MICHAEL BEST & FRIEDRICH LLC |
J. WARREN WHITESEL |
ATTORNEYS AT LAW |
401 NORTH MICHIGAN AVENUE |
CHICAGO, ILLINOIS 60611-4212 |
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