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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/20/2004
Application #:
09733228
Filing Dt:
12/08/2000
Publication #:
Pub Dt:
09/12/2002
Inventors:
Noriaki Matsunaga, Hideki Shibata, Nobuo Hayasaka
Title:
PROBE PIN FOR TESTING ELECTRICAL CHARACTERISTICS OF APPARATUS, PROBE CARD USING PROBE PINS
Assignment: 1
Reel/Frame:
011362/0674Recorded: 12/08/2000Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/27/2000
Exec Dt:
11/27/2000
Exec Dt:
11/27/2000
Assignee:
72 HORIKAWA-CHO, SAIWAI-KU
KAWASAKI-SHI, KANAGAWA-KEN, JAPAN
Correspondent:
PILLSBURY MADISON & SUTRO LLP
ROGER R. WISE, ESQ.
725 SOUTH FIGUEROA STREET
SUITE 1200
LOS ANGELES, CA 90017-5443

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