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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
04/29/2003
Application #:
10028308
Filing Dt:
12/28/2001
Publication #:
Pub Dt:
09/26/2002
Inventors:
Young-Seon You, Yoon-Soo Jang, Mun-Hwa Lee, Tae-Kyu Kim
Title:
METHOD FOR TESTING MEMORY CELL IN SEMICONDUCTOR DEVICE
Assignment: 1
Reel/Frame:
012767/0661Recorded: 04/05/2002Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
03/06/2002
Exec Dt:
03/06/2002
Exec Dt:
03/06/2002
Exec Dt:
03/06/2002
Assignee:
SAN 136-1, AMI-RU, BUBAL-EUB, ICHON-SHI
KYOUNGKI-DO, KOREA, REPUBLIC OF 467-8
Correspondent:
BIRCH, STEWART, KOLASCH & BIRCH, LLP
JOSEPH A. KOLASCH
P.O. BOX 747
FALLS CHURCH, VA 22040-0747

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