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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
09873610
Filing Dt:
06/04/2001
Publication #:
Pub Dt:
12/05/2002
Inventors:
David Allen Murtishaw, Michael Gerald King, Marcio Antonio Chinn
Title:
System and method for measuring the thickness of material layers applied in the funnel of a cathode ray tube during manufacture
Assignment: 1
Reel/Frame:
011877/0422Recorded: 06/04/2001Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
05/18/2001
Exec Dt:
05/18/2001
Exec Dt:
05/18/2001
Assignees:
7-35 KITASHINAGAWA 6-CHOME
SHINAGAWA-KU, TOKYO, JAPAN
1 SONY DRIVE
PARK RIDGE, NEW JERSEY 07656
Correspondent:
PARSONS, BEHLE & LATIMER
STEVEN L. NICHOLS, ESQ.
201 SOUTH MAIN STREET, SUITE 1800
SALT LAKE CITY, UT 84111

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