Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10116128
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Filing Dt:
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04/05/2002
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Publication #:
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Pub Dt:
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12/19/2002
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Inventors:
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Laung-Terng Wang, Shyh-Horng Lin, Chi-Chan Hsu, Xiaoqing Wen, Anthony M. Vu, Yo Han Park et al
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Title:
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Method and system to optimize test cost and disable defects for scan and BIST memories
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 505 S. PASTORIA AVENUE SUITE 101 |
| SUNNYVALE, CALIFORNIA 94086 |
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| JIM ZEGEER |
| 801 N. PITT STREET |
| SUITE 108 |
| ALEXANDRIA, VA 22314 |
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