Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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10/26/2004
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Application #:
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10189599
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Filing Dt:
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07/08/2002
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Publication #:
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Pub Dt:
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01/16/2003
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Inventors:
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Seiichiro Ishio, Yasutoshi Suzuki, Hirofumi Funahashi, Hajime Ito, Yasuaki Makino et al
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Title:
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METHOD OF MEASURING A CHARACTERISTIC OF A CAPACITIVE TYPE OF SENSOR, A SENSOR CHARATERISTIC MEASURING APPARATUS, A CAPACITIVE TYPE OF SENSOR APPARATUS, AND AN IC CHIP FOR MEASURING A SENSOR CHARACTERISTIC
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, SHOWA-CHO, KARIYA-CITY |
| AICHI-PREF. 448-0029, JAPAN |
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| LAW OFFICES OF DAVID G. POSZ |
| DAVID G. POSZ |
| 2000 L STREET, NW. |
| STE. 200 |
| WASHINGTON, DC 20036 |
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Assignment:
2
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CORRECTIVE ASSIGNMENT TO CORRECT THE SEVENTH CONVEYING PARTY'S NAME PREVIOUSLY RECORDED ON REEL 013086 FRAME 0321 ASSIGNOR HEREBY CONFIRMS THE ASSIGNMENT OF THE ENTIRE INTEREST.
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| 1-1, SHOWA-CHO, |
| KARIYA-CITY, AICHI-PREF. 448-0029, JAPAN |
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| LAW OFFICE OF DAVID G. POSZ |
| DAVID G. POSZ |
| 2000 L STREET, N.W., SUITE 200 |
| WASHINGTON, D.C. 20036 |
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