Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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09/30/2003
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Application #:
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09928001
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Filing Dt:
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08/10/2001
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Publication #:
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Pub Dt:
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02/13/2003
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Inventors:
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Andreas C. Pfahnl, John J. Dunn JR.
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Title:
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METHODS AND APPARATUS FOR TESTING A SEMICONDUCTOR STRUCTURE USING IMPROVED TEMPERATURE DESOAK TECHNIQUES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 321 HARRISON AVENUE |
| BOSTON, MASSACHUSETTS 02118 |
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| CHAPIN & HUANG, L.L.C. |
| DAVID E. HUANG, ESQ. |
| WESTBOROUGH OFFICE PARK |
| 1700 WEST PARK DRIVE |
| WESTBOROUGH, MA 01581 |
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Assignment:
2
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NOTICE OF GRANT OF SECURITY INTEREST IN PATENTS
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| 901 MAIN STREET |
| TX1-492-14-06, MAC |
| DALLAS, TEXAS 75202-3714 |
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| MOORE & VAN ALLEN PLLC |
| 430 DAVIS DRIVE |
| SUITE 500 |
| MORRISVILLE, NC 27560 |
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Assignment:
3
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RELEASE BY SECURED PARTY (SEE DOCUMENT FOR DETAILS).
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| 600 RIVERPARK DRIVE |
| NORTH READING, MASSACHUSETTS 02038 |
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| TERADYNE, INC |
| 600 RIVERPARK DRIVE |
| NORTH READING, MA 02038 |
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