Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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11/09/2004
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Application #:
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10226140
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Filing Dt:
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08/23/2002
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Publication #:
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Pub Dt:
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02/27/2003
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Inventor:
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Tatsuya Ishii
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Title:
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ELECTRON BEAM TEST SYSTEM AND ELECTRON BEAM TEST METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4-1, NISHI-SHINJUKU 2-CHOME |
| SHINJUKU-KU, TOKYO, JAPAN |
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| OLIFF & BERRIDGE, PLC |
| JAMES A. OLIFF |
| P.O. BOX 19928 |
| ALEXANDRIA, VA 22320 |
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