Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/23/2003
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Application #:
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09989850
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Filing Dt:
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11/20/2001
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Publication #:
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Pub Dt:
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05/22/2003
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Inventors:
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Wagdi W. Abadeer, Eric Adler, Jeffrey S. Brown, Robert J. Gauthier JR. et al
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Title:
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TEST STRUCTURE AND METHODOLOGY FOR SEMICONDUCTOR STRESS-INDUCED DEFECTS AND ANTIFUSE BASED ON SAME TEST STRUCTURE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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NEW ORCHARD ROAD |
ARMONK, NEW YORK 10504 |
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SCHMEISER, OLDEN & WATTS |
HOWARD J. WALTER, JR. |
SUITE 301, 3 LEAR JET |
LATHAM, NY 12033 |
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