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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
11/04/2003
Application #:
10017070
Filing Dt:
12/13/2001
Publication #:
Pub Dt:
06/19/2003
Inventors:
Stacy K. Firth, W. Jarrett Campbell
Title:
SYSTEM AND METHOD FOR CONTROLLING CRITICAL DIMENSION IN A SEMICONDUCTOR MANUFACTURING PROCESS
Assignment: 1
Reel/Frame:
012758/0629Recorded: 03/28/2002Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/11/2002
Exec Dt:
02/11/2002
Assignee:
986 WALSH AVENUE
SANTA CLARA, CALIFORNIA 95050
Correspondent:
GARY CARY WARE & FREIDENRICH LLP
DAVID L. ALBERTI
1755 EMBARCADERO ROAD
PALO ALTO, CA 94303-3340
Assignment: 2
Reel/Frame:
026232/0254Recorded: 05/05/2011Pages: 4
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
04/27/2010
Assignee:
2 TECH DRIVE
SUITE 201
ANDOVER, MASSACHUSETTS 01810
Correspondent:
PROSKAUER ROSE LLP
ONE INTERNATIONAL PLACE
BOSTON, MA 02110

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