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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
09/14/2004
Application #:
10306129
Filing Dt:
11/31/2018
Publication #:
Pub Dt:
07/10/2003
Inventors:
Hiroyuki Mikami, Yasutaka Tsuruki
Title:
VARIABLE DELAY CIRCUIT AND A TESTING APPARATUS FOR A SEMICONDUCTOR CIRCUIT
Assignment: 1
Reel/Frame:
013851/0757Recorded: 03/18/2003Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
02/26/2003
Exec Dt:
02/26/2003
Assignee:
1-32-1, ASAHI-CHO, NERIMA-KU
TOKYO, JAPAN 179-0071
Correspondent:
ROSENTHAL & OSHA LLP.
JONATHAN P. OSHA
1221 MCKINNEY
STE. 2800
HOUSTON, TX 77010

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