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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
10047755
Filing Dt:
01/14/2002
Publication #:
Pub Dt:
07/17/2003
Inventor:
Te-Wei Chen
Title:
Analogue signal testing system for integrated circuit
Assignment: 1
Reel/Frame:
012509/0795Recorded: 01/14/2002Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
12/04/2001
Assignee:
SCIENCE-BASED INDUSTRIAL PARK
7F-3, NO. 9, PROSPERITY FIRST RD.
HSINCHU, TAIWAN R.O.C
Correspondent:
J.C. PATENTS, INC.
JIAWEI HUANG
4 VENTURE, SUTIE 250
IRVINE, CA 92618

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