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Patent Assignment Abstract of Title

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Total Assignments: 2

Patent #:	NONE	Issue Dt:		Application #:	10353946	Filing Dt:	01/30/2003
Publication #:	20030179921	Pub Dt:	09/25/2003
Inventors:	Kaoru Sakai, Shunji Maeda, Takafumi Okabe, Naoya Takeuchi, Hiroshi Goto et al
Title:	Pattern inspection method and its apparatus

Assignment: 1

Reel/Frame:

014115/0101

Recorded: 05/28/2003

Pages: 2

Conveyance:

ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).

Assignors:

SAKAI, KAORU

Exec Dt:

04/10/2003

MAEDA, SHUNJI

Exec Dt:

04/17/2003

OKABE, TAKAFUMI

Exec Dt:

04/10/2003

GOTO, HOROSHI

Exec Dt:

04/24/2003

KUWABARA, MASAYUKI

Exec Dt:

04/23/2003

TAKEUCHI, NAOYA

Exec Dt:

04/23/2003

Assignees:

HITACHI, LTD.

6, KANDA SURUGADAI 4-CHOME

CHIYODA-KU, TOKYO, JAPAN

HITACHI HIGH-TECHNOLOGIES CORPORATION

24-14, NISHISHINBASHI 1-CHOME

MINATO-KU, TOKYO, JAPAN

SEIMITSU CO., LTD.

9-7-1, SHIMORENJAKU

MITAKA-SHI, TOKYO, JAPAN

Correspondent:

ANTONELLI TERRY STOUT, ET AL.

MELVIN KRAUS

1300 NORTH 17TH STREET

SUITE 1800

ARLINGTON, VA 22209

Assignment: 2

Reel/Frame:

023062/0878

Recorded: 08/06/2009

Pages: 3

Conveyance:

CORRECTIVE ASSIGNMENT TO CORRECT THE THE 3RD. ASSIGNEE'S NAME AND THE 4TH. INVENTOR'S NAME, PREVIOUSLY RECORDED ON REEL 014115 FRAME 0101. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT.

Assignors:

SAKAI, KAORU

Exec Dt:

04/10/2003