Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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08/23/2005
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Application #:
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10394223
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Filing Dt:
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03/24/2003
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Publication #:
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Pub Dt:
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10/02/2003
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Inventors:
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Hiroyuki Wada, Yoshimi Hirata, Ayumu Taguchi, Koichi Tatsuki, Nobuhiko Umezu et al
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Title:
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POLYSILICON EVALUATING METHOD, POLYSILICON INSPECTION APPARATUS AND METHOD FOR PREPARATION OF THIN FILM TRANSISTOR
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7-35 KITASHINAGAWA 6-CHOME, SHINAGAWA-KU |
| TOKYO, JAPAN 141-0001 |
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| JEAN C. EDWARDS |
| P.O. BOX 061080 |
| WACKER DRIVE STATION |
| CHICAGO, IL 60606-1080 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 50 AZA KAMIFUNAKI, O-AZA OGAWA, |
| HIGASHIURA-CHO, CHITA-GUN |
| AICHI-KEN, JAPAN 470-2102 |
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| DANIEL M. GURFINKEL |
| 120 SOUTH LASALLE STREET, SUITE 1400 |
| CHICAGO, IL 60603 |
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