Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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01/31/2006
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Application #:
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10389751
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Filing Dt:
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03/18/2003
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Publication #:
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Pub Dt:
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10/16/2003
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Inventors:
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Hiroyuki Okada, Miki Shibata, Tadahiro Echigo, Shigeki Naka, Hiroyoshi Onnagawa
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Title:
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FILM THICKNESS MEASURING METHOD AND MEASURING APPARATUS FOR ORGANIC THIN FILM FOR USE IN ORGANIC ELECTROLUMINESCE DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3190, GOFUKU |
| TOYAMA-SHI, TOYAMA-KEN, JAPAN |
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| OBLON, SPIVAK, MCCLELLAND & ET AL |
| 1940 DUKE STREET |
| ALEXANDRIA, VA 22314 |
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Assignment:
2
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RECORD TO CORRECT THE 5TH ASSIGNOR'S NAME. DOCUMENT PREVIOUSLY RECORDED ON REEL 013891 FRAME 0010. ASSIGNOR HEREBY CONFIRMS THE ASSIGNMENT OF THE ENTIRE INTEREST.
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| 3190, GOFUKU, TOYAMA-SHI |
| TOYAMA-KEN, JAPAN |
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| OBLON, SPIVAK, MCCLELLAND, MAIER & NEUST |
| 1940 DUKE STREET |
| ALEXANDRIA, VA 22314 |
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