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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
05/02/2006
Application #:
10396083
Filing Dt:
03/24/2003
Publication #:
Pub Dt:
10/16/2003
Inventor:
Norio Koike
Title:
METHOD OF ESTIMATING A LIFETIME OF HOT CARRIER OF MOS TRANSISTOR, AND SIMULATION OF HOT CARRIER DEGRADATION
Assignment: 1
Reel/Frame:
013917/0904Recorded: 03/24/2003Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
03/14/2003
Assignee:
1006, OAZA KADOMA
KADOMA-SHI, OSAKA 571-8501, JAPAN
Correspondent:
MERCHANT & GOULD PC
DOUGLAS P. MUELLER
3200 IDS CENTER
80 SOUTH EIGHTH STREET
MINNEAPOLIS, MN 55402-0903

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