Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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Issue Dt:
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05/17/2005
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Application #:
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10355068
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Filing Dt:
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01/31/2003
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Publication #:
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Pub Dt:
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11/27/2003
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Inventors:
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Kyoji Yamashita, Hiroyuki Umimoto, Mutsumi Kobayashi, Katsuhiro Ohtani et al
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Title:
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SEMICONDUCTOR DEVICE AND CAPACITANCE MEASUREMENT METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1006, OAZA KADOMA |
| KADOMA-SHI, OSAKA, JAPAN 571-8501 |
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| 2-3, MARUNOUCHI 2-CHOME |
| CHIYODA-KU, TOKYO, JAPAN 100-8310 |
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| NIXON PEABODY LLP |
| DONALD R. STUDEBAKER |
| 8180 GREENSBORO DRIVE |
| SUITE 800 |
| MCLEAN, VA 22102 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4-1, MARUNOUCHI 2-CHOME, CHIYODA-KU |
| TOKYO, JAPAN 100-6334 |
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| MCDERMOTT, WILL & EMERY |
| STEPHEN A. BECKER |
| 600 13TH STREET, N.W. |
| WASHINGTON, DC 20005-3096 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4-1, MARUNOUCHI 2-CHOME, CHIYODA-KU |
| TOKYO, JAPAN 100-6334 |
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| MCDERMOTT, WILL & EMERY |
| STEPHEN A. BECKER |
| 600 13TH STREET, N.W. |
| WASHINGTON, DC 20005-3096 |
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