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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
07/20/2004
Application #:
10335947
Filing Dt:
01/03/2003
Publication #:
Pub Dt:
12/04/2003
Inventor:
Morihiko Hamada
Title:
SEMICONDUCTOR TESTING APPARATUS FOR CONDUCTING CONDUCTION TESTS
Assignment: 1
Reel/Frame:
013647/0134Recorded: 01/03/2003Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
11/27/2002
Assignee:
1-1, KAMIKODANAKA 4-CHOME, NAKAHARA-KU
KAWASAKI-SHI, KANAGAWA, JAPAN 211-8588
Correspondent:
ARENT FOX KINTNER ET.AL.
CHARLES M. MARMELSTEIN
1050 CONNECTICUT AVE., N.W., SUITE 400
WASHINGTON, D.C. 20036-5339

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