Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/21/2004
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Application #:
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10617387
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Filing Dt:
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07/11/2003
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Publication #:
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Pub Dt:
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01/15/2004
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Inventors:
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Hideaki Sakaguchi, Masayuki Ehiro, Masami Mori
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Title:
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SEMICONDUCTOR TESTING APPARATUS AND SEMICONDUCTOR TESTING METHOD
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 22-22, NAGAKECHO, ABENO-KU |
| OSAKA, JAPAN 545-8522 |
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| NIXON & VANDERHYE P.C. |
| H. WARREN BURNAM, JR. |
| 1100 N. GLEBE ROAD, 8TH FLOOR |
| ARLINGTON, VA 22201 |
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