Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10464761
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Filing Dt:
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06/19/2003
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Publication #:
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Pub Dt:
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02/12/2004
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Inventors:
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Yasuhiro Gunji, Taku Ninomya, Ryuichi Funatsu, Yoshikazu Inada, Kenjirou Yamamoto et al
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Title:
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Inspection method and inspection apparatus using electron beam
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 24-14, NISHISHIMBASHI 1-CHOME MINATO-KU |
| TOKYO 105-8717, JAPAN |
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| DICKSTEIN SHAPIRO MORIN ET AL |
| MARK J. THRONSON |
| 2101 L STREET N.W |
| WASHINGTON, DC 20037-1526 |
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