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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
04/05/2005
Application #:
10475371
Filing Dt:
10/21/2003
Publication #:
Pub Dt:
06/10/2004
Inventors:
Steffen Gappisch, Georg Farkas
Title:
INTEGRATED CIRCUIT WITH SELF-TEST DEVICE FOR AN EMBEDDED NON-VOLATILE MEMORY AND RELATED TEST METHOD
Assignment: 1
Reel/Frame:
015007/0660Recorded: 10/21/2003Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
11/19/2002
Exec Dt:
11/19/2002
Assignee:
GROENEWOUDSEWEG 1
EINDHOVEN, NETHERLANDS
Correspondent:
PHILIPS ELECTRONICS NORTH AMERICA CORP.
MICHAEL E. MARION
345 SCARBOROUGH ROAD
BRIARCLIFF MANOR, NY 10510
Assignment: 2
Reel/Frame:
018635/0787Recorded: 12/15/2006Pages: 51
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
11/17/2006
Assignee:
HIGH TECH CAMPUS 60
5656 AG EINDHOVEN, NETHERLANDS
Correspondent:
ELIZABETH PARSONS
1825 EYE STREET, NW
WASHINGTON, DC 20006

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