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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
10611172
Filing Dt:
07/02/2003
Publication #:
Pub Dt:
06/17/2004
Inventor:
Hideshi Maeno
Title:
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE WITH TEST CIRCUIT
Assignment: 1
Reel/Frame:
014254/0864Recorded: 07/02/2003Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/06/2003
Assignee:
4-1, MARUNOUCHI 2-CHOME
CHIYODA-KU, TOKYO 100-6334, JAPAN
Correspondent:
BURNS DOANE ET AL.
PLATON N. MANDROS
P.O. BOX 1404
ALEXANDRIA, VA 22313-1404

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