Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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08/10/2004
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Application #:
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09820143
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Filing Dt:
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03/28/2001
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Publication #:
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Pub Dt:
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07/08/2004
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Inventors:
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Uzodinma Okoroanyanwu, Bhanwar Singh, Alden Acheta
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Title:
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SEM INSPECTION AND ANALYSIS OF PATTERNED PHOTORESIST FEATURES
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| ONE AMD PLACE |
| SUNNYVALE, CALIFORNIA 94088 |
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| FOLEY & LARDNER |
| KATHERINE D. LEE |
| FIRSTAR CENTER |
| 777 EAST WISCONSIN AVENUE |
| MILWAUKEE, WI 53202-5367 |
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