Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10725938
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Filing Dt:
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12/03/2003
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Publication #:
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Pub Dt:
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08/12/2004
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Inventor:
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Holger Hoppe
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Title:
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Testing apparatus and method for testing the contacting between a semiconductor device and a carrier
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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ST.-MARTIN-STRASSE 53 |
81669 MUNICH, GERMANY |
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MORRISON & FOERSTER LLP |
KEVIN R. SPIVAK |
1650 TYSONS BOULEVARD |
SUITE 300 |
MCLEAN, VA 22102 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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ST.-MARTIN-STR. 53 |
81669 MUNCHEN, GERMANY |
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KEVIN R. SPIVAK |
MORRISON & FOERSTER LLP |
1650 TYSONS BOULEVARD |
SUITE 300 |
MCLEAN, VIRGINIA 22102 |
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