Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10759462
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Filing Dt:
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01/16/2004
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Publication #:
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Pub Dt:
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09/16/2004
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Inventors:
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Rochit Rajsuman, Robert Sauer, Hiroaki Yamoto
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Title:
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Semiconductor test system storing pin calibration data, commands and other data in non-volatile memory
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 336-1 OHWA, MEIWA-MACHI |
| ORA-GUN, GUNMA 370-0718, JAPAN |
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| MORRISON & FOERSTER LLP |
| GLENN M. KUBOTA |
| 555 WEST FIFTH STREET |
| SUITE 3500 |
| LOS ANGELES, CA 90013-1024 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-32-1, ASAHI-CHO |
| NERIMA-KU, TOKYO 179-0071, JAPAN |
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| GLENN M. KUBOTA |
| MORRISON & FOERSTER LLP |
| 555 WEST FIFTH STREET |
| SUITE 3500 |
| LOS ANGELES, CA 90013-1024 |
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