Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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11/08/2005
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Application #:
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10750838
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Filing Dt:
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01/05/2004
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Publication #:
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Pub Dt:
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09/30/2004
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Inventors:
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Shuichi Takeuchi, Mine Nakagawa, Mitsugu Sato, Atsushi Takane, Kazutaka Nimura
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Title:
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SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVING METHOD USING IT
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 24-14, NISHISHIMBASHI 1-CHOME |
| MINATO-KU, TOKYO, JAPAN |
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| 1040, ICHIGE |
| HITACHINAKA-SHI |
| IBARAKI 312-0033, JAPAN |
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| DICKSTEIN SHAPIRO MORIN & OSHINSKY, LLP |
| MARK J. THRONSON |
| 2101 L STREET NW |
| WASHINGTON, DC 20037-1526 |
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Assignment:
2
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CHANGE OF NAME AND ADDRESS
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| 17-1, TORANOMON 1-CHOME, MINATO-KU |
| TOKYO, JAPAN |
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| MATTINGLY & MALUR PC |
| 1800 DIAGONAL ROAD |
| SUITE 210 |
| ALEXANDRIA, VA 22314 |
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