Patent Assignment Abstract of Title
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Total Assignments:
4
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Patent #:
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Issue Dt:
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11/01/2005
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Application #:
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10406645
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Filing Dt:
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04/03/2003
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Publication #:
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Pub Dt:
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10/07/2004
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Inventors:
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Michael Maldei, Prakash C. Dev, David Dobuzinsky, Johnathan Faltermeier et al
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Title:
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METHOD OF REDUCING EROSION OF A NITRIDE GATE CAP LAYER DURING REACTIVE ION ETCH OF NITRIDE LINER LAYER FOR BIT LINE CONTACT OF DRAM DEVICE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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1730 NORTH FIRST STREET |
SAN JOSE, CALIFORNIA 95112 |
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LERNER, DAVID, LITTENBERG, ET AL. |
LAWRENCE E. RUSS |
600 SOUTH AVENUE WEST |
WESTFIELD, NJ 07090 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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NEW ORCHARD ROAD |
ARMONK, NEW YORK 10504 |
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LERNER DAVID LITTENBERG, KRUMHOLZ ET AL. |
600 SOUTH AVENUE WEST |
WESTFIELD, NJ 07090 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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ST. MARTIN-STR. 53 |
81669 MUNICH, GERMANY |
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INFINEON TECHNOLOGIES NORTH AMERICA CORP |
C/O SIEMENS CORPORATION, IP DEPT. |
ERIK O. BERGER, ESQ. |
170 WOOD AVENUE SOUTH |
ISELIN, NJ 08830 |
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Assignment:
4
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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GUSTAV-HEINEMANN-RING 212 |
MUNICH, GERMANY 81739 |
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JONATHAN BOCKMAN |
C/O MORRISON & FOERSTER LLP |
1650 TYSONS BOULEVARD SUITE 400 |
MCLEAN, VA 22102 |
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