Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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12/25/2007
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Application #:
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10401871
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Filing Dt:
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03/31/2003
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Publication #:
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Pub Dt:
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10/14/2004
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Inventors:
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Naoko Yamaguchi, Yoshiaki Sugizaki, Hideo Aoki, Toshiro Hiraoka, Yasuyuki Hotta et al
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Title:
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SEMICONDUCTOR TEST UNIT HAVING LOW CONTACT RESISTANCE WITH EXAMINED ELECTRONIC PRODUCTS, SEMICONDUCTOR CONTACT BOARD, METHOD FOR TESTING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, AND METHOD FOR MANUFACTURING THEREOF
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-1, SHIBAURA 1-CHOME, MINATO-KU |
| TOKYO, JAPAN |
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| OBLON, SPIVAK, MCCLELLAND, MAIER & NEUST |
| 1940 DUKE STREET |
| ALEXANDRIA, VA 22314 |
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