Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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Issue Dt:
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10/14/2008
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Application #:
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10772327
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Filing Dt:
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02/06/2004
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Publication #:
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Pub Dt:
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11/11/2004
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Inventors:
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Ankan Pramanick, Mark Elston, Leon Chen, Robert Sauer
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Title:
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METHOD AND APPARATUS FOR TESTING INTEGRATED CIRCUITS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1-32-1 ASAHI-CHO |
| NERIMA-KU, TOKYO, JAPAN 179-0071 |
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| MORRISON & FOERSTER LLP |
| ROBERT A. SALTZBERG |
| 425 MARKET STREET |
| SAN FRANCISCO, CA 94105 |
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Assignment:
2
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| 1-6-2, MARUNOUCHI, CHIYODA-KU |
| TOKYO, JAPAN 100-0005 |
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| ADVANTEST C/O MURABITO HAO & BARNES LLP |
| TWO NORTH MARKET STREET |
| THIRD FLOOR |
| SAN JOSE, CA 95113 |
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