Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10665451
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Filing Dt:
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09/19/2003
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Publication #:
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Pub Dt:
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11/11/2004
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Inventors:
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Wen-Chuan Wang, Shih-Ming Chang, Chih-Cheng Chin, Chi-Lun Lu, Sheng-Chi Chin et al
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Title:
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System and method for examining mask pattern fidelity
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| NO. 8, LI-HSIN ROAD 6 |
| SCIENCE BASED INDUSTRIAL PARK |
| HSIN-CHU, TAIWAN R.O.C. 300-77 |
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| DUANE MORRIS LLP |
| WILLIAM H. MURRAY |
| ONE LIBERTY PLACE |
| PHILADELPHIA, PA 19103 |
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