Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10760661
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Filing Dt:
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01/15/2004
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Publication #:
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Pub Dt:
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12/02/2004
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Inventors:
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Mark L. Jones, Ansgar Koch, Fumitoshi Ito, James J. Shen
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Title:
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Method of analyzing a wafer for metal impurities
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 7200 N.W. FRONT AVENUE |
| PORTLAND, OREGON 97210 |
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| KOLISCH HARTWELL, P.C. |
| M. MATTHEWS HALL |
| 520 S.W. YAMHILL STREET, SUITE 200 |
| PORTLAND, OR 97204 |
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