Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10864963
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Filing Dt:
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06/10/2004
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Publication #:
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Pub Dt:
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12/16/2004
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Inventors:
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Timothy R. Tiemeyer, James S. Akutsu
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Title:
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Method and system for analyzing and tracking defects among a plurality of substrates such as silicon wafers
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 80 WILSON WAY |
| WESTWOOD, MASSACHUSETTS 02090 |
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| ALSTON & BIRD LLP |
| DONALD M. HILL, JR. |
| BANK OF AMERICA PLAZA |
| 101 SOUTH TRYON STREET, SUITE 4000 |
| CHARLOTTE, NC 28280-4000 |
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