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Patent Assignment Abstract of Title
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Total Assignments: 3
Patent #:
Issue Dt:
03/20/2007
Application #:
10774520
Filing Dt:
02/09/2004
Publication #:
Pub Dt:
01/06/2005
Inventor:
Detlef Michelsson
Title:
METHOD AND APPARATUS FOR SCANNING A SEMICONDUCTOR WAFER
Assignment: 1
Reel/Frame:
015240/0851Recorded: 10/08/2004Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
12/11/2003
Assignee:
ERNST-LEITZ-STRASSE 17-37
WETZLAR, GERMANY D-35578
Correspondent:
HOUSTON ELISEEVA
4 MILITIA DRIVE, SUITE 4
LEXINGTON, MA 02421
Assignment: 2
Reel/Frame:
015737/0947Recorded: 03/07/2005Pages: 5
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
12/22/2004
Assignee:
19 AVENUE DE MESSINE
PARIS, FRANCE 75008
Correspondent:
PATRICIA ANN MERRILL
77 WEST WACKER
JONES DAY
CHICAGO, IL 60601-1692
Assignment: 3
Reel/Frame:
018885/0221Recorded: 02/13/2007Pages: 6
Conveyance:
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
06/02/2006
Assignee:
KUBACHER WEG 4
WEILBURG, GERMANY D-35781
Correspondent:
MARIA ELISEEVA
HOUSTON ELISEEVA LLP
4 MILITIA DRIVE, SUITE 4
LEXINGTON, MA 02421

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