Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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04/07/2015
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Application #:
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10883372
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Filing Dt:
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07/01/2004
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Publication #:
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Pub Dt:
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01/06/2005
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Inventors:
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William Volk, James Wiley, Sterling Watson, Ellis Chang, Sagar A. Kekare, Carl Hess et al
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Title:
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Methods and systems for inspection of wafers and reticles using designer intent data
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Assignment:
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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ONE TECHNOLOGY DRIVE |
MILPITAS, CALIFORNIA 95035 |
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CONLEY ROSE, P.C. |
ANN MARIE MEWHERTER |
P.O. BOX 684908 |
AUSTIN, TX 78768-4908 |
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