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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
02/28/2006
Application #:
10823786
Filing Dt:
04/14/2004
Publication #:
Pub Dt:
01/20/2005
Inventors:
Cheng Ping Wei, Jun Shen
Title:
WAFER-LEVEL TESTER WITH MAGNET TO TEST LATCHING MICRO-MAGNETIC SWITCHES
Assignment: 1
Reel/Frame:
015416/0512Recorded: 12/03/2004Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
08/10/2004
Exec Dt:
08/10/2004
Assignee:
341 E. ALAMO DRIVE
CHANDLER, ARIZONA 85225
Correspondent:
STERNE, KESSLER, GOLDSTEIN & FOX P.L.L.C
1100 NEW YORK AVENUE, N.W.
WASHINGTON, DC 20005
Assignment: 2
Reel/Frame:
018194/0534Recorded: 09/01/2006Pages: 4
Conveyance:
CONFIRMATORY ASSIGNMENT
Assignor:
Exec Dt:
07/24/2006
Assignee:
89, BOULEVARD F. ROOSEVELT
RUEIL-MALMAISON, FRANCE 92500
Correspondent:
STERNE, KESSLER, GOLDSTEIN & FOX P.L.L.C
1100 NEW YORK AVENUE, N.W.
WASHINGTON, DC 20005

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