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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
09/18/2007
Application #:
10754679
Filing Dt:
01/09/2004
Publication #:
Pub Dt:
01/27/2005
Inventor:
David W. Shortt
Title:
METHOD AND APPARATUS FOR DETERMINING SURFACE LAYER THICKNESS USING CONTINUOUS MULTI-WAVELENGTH SURFACE SCANNING
Assignment: 1
Reel/Frame:
014884/0058Recorded: 01/09/2004Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
01/08/2004
Assignee:
ONE TECHNOLOGY DRIVE
MILPITAS, CALIFORNIA 95035
Correspondent:
BEYER WEAVER & THOMAS, LLP
P.O. BOX 778
BERKELEY, CA 94704-0778

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