Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications.
For pending or abandoned applications please consult USPTO staff.
|
Total Assignments:
2
|
|
Patent #:
|
|
Issue Dt:
|
02/14/2006
|
Application #:
|
10933977
|
Filing Dt:
|
09/03/2004
|
|
Publication #:
|
|
Pub Dt:
|
02/03/2005
| | | | |
|
Inventors:
|
Hidetoshi Nishiyama, Minori Noguchi, Yoshimasa Ooshima, Akira Hamamatsu, Kenji Watanabe et al
|
|
Title:
|
METHOD AND ITS APPARATUS FOR INSPECTING PARTICLES OR DEFECTS OF A SEMICONDUCTOR DEVICE
|
|
|
Assignment:
1
|
|
|
|
|
|
|
CHANGE OF NAME (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 16-3, HIGASHI 3-CHOME, SHIBUYA-KU |
| TOKYO, JAPAN |
|
|
|
|
| GEORGE B.F. YEE |
| TOWNSEND AND TOWNSEND AND CREW LLP |
| TWO EMBARCADERO CENTER |
| EIGHTH FLOOR |
| SAN FRANCISCO, CA 94111-3834 |
|
|
|
Assignment:
2
|
|
|
|
|
|
|
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
|
|
|
|
|
|
|
|
|
| 24-14, NISHISHINBASHI 1-CHOME |
| MINATO-KU |
| TOKYO, JAPAN |
|
|
|
|
| GEORGE B. F. YEE |
| TOWNSEND AND TOWNSEND AND CREW LLP |
| TWO EMBARCADERO CENTER |
| EIGHTH FLOOR |
| SAN FRANCISCO, CA 94111-3834 |
|
|
Search Results as of:
05/01/2024 10:20 PM
If you have any comments or questions concerning the data displayed,
contact
PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified:
August 25, 2017 v.2.6
|
