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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
01/13/2009
Application #:
10875509
Filing Dt:
06/25/2004
Publication #:
Pub Dt:
03/10/2005
Inventors:
Kenji Watanabe, Tadashi Otaka, Ryo Nakagaki, Chie Shishido, Masakazu Takahashi et al
Title:
SAMPLE DIMENSION-MEASURING METHOD AND CHARGED PARTICLE BEAM APPARATUS
Assignment: 1
Reel/Frame:
015992/0717Recorded: 11/16/2004Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
10/18/2004
Exec Dt:
10/18/2004
Exec Dt:
10/21/2004
Exec Dt:
10/22/2004
Exec Dt:
10/19/2004
Exec Dt:
10/29/2004
Assignee:
24-14, NISHISHINBASHI 1-CHOME
MINATO-KU
TOKYO, JAPAN
Correspondent:
MCDERMOTT WILL & EMERY LLP
600 13TH STREET, N.W.
WASHINGTON, D.C. 20005-3096
Assignment: 2
Reel/Frame:
052259/0227Recorded: 03/30/2020Pages: 68
Conveyance:
CHANGE OF NAME AND ADDRESS
Assignor:
Exec Dt:
02/12/2020
Assignee:
17-1, TORANOMON 1-CHOME, MINATO-KU
TOKYO, JAPAN
Correspondent:
MATTINGLY & MALUR PC
1800 DIAGONAL ROAD
SUITE 210
ALEXANDRIA, VA 22314

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