Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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09/20/2005
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Application #:
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10655850
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Filing Dt:
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09/04/2003
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Publication #:
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Pub Dt:
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03/10/2005
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Inventor:
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Wun Wang
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Title:
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SYSTEM AND METHOD FOR EFFECTIVE YIELD LOSS ANALYSIS FOR SEMICONDUCTOR WAFERS
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 3F., NO. 19, LI HSIN RD. |
| SCIENCE-BASED INDUSTRIAL PARK |
| HSINCHU, TAIWAN R.O.C. |
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| J.C. PATENTS, INC. |
| SUITE 250 |
| 4 VENTURE, |
| IRVINE, CA 92618 |
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