skip navigationU S P T O SealUnited States Patent and Trademark Office AOTW logo
Home|Site Index|Search|Guides|Contacts|eBusiness|eBiz alerts|News|Help
Assignments on the Web > Patent Query
Patent Assignment Abstract of Title
NOTE:Results display only for issued patents and published applications. For pending or abandoned applications please consult USPTO staff.

Total Assignments: 1
Patent #:
NONE
Issue Dt:
Application #:
10625695
Filing Dt:
07/24/2003
Publication #:
Pub Dt:
05/12/2005
Inventors:
Kazuhiro Nakajima, Kouji Kanba
Title:
Production process for producing semiconductor devices, semiconductor devices produced thereby, and test system for carrying out yield-rate test in production of such semiconductor devices
Assignment: 1
Reel/Frame:
014333/0374Recorded: 07/24/2003Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
07/14/2003
Exec Dt:
07/14/2003
Assignee:
1753 SHIMONUMABE
NAKAHARA-KU, KANAGAWA
KAWASAKI-SHI, JAPAN
Correspondent:
YOUNG & THOMPSON
745 SOUTH 23RD STREET 2ND FLOOR
ARLINGTON, VA 22202

Search Results as of: 04/19/2024 09:48 AM
If you have any comments or questions concerning the data displayed, contact PRD / Assignments at 571-272-3350. v.2.6
Web interface last modified: August 25, 2017 v.2.6
| .HOME | INDEX| SEARCH | eBUSINESS | CONTACT US | PRIVACY STATEMENT