Patent Assignment Abstract of Title
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Total Assignments:
3
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10468794
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Filing Dt:
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08/22/2003
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Publication #:
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Pub Dt:
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05/12/2005
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Inventors:
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Norihiko Sugita, Tetsuo Ishiguro, Naoki Yashiki
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Title:
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Semiconductor device and its test method
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4-1, MARUNOUCHI 2-CHOME |
| CHIYODA-KU, TOKYO, JAPAN |
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| 22-1 JOSUIHONCHO 5-CHOME |
| KODAIRA-SHI, TOYKO, JAPAN |
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| REED SMITH LLP |
| STANLEY P. FISHER |
| 3110 FAIRVIEW PARK DR. |
| SUITE 1400 |
| FALLS CHURCH, VA 22042 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4-1, MARUNOUCHI 2-CHOME |
| CHIYODA-KU, TOKYO, JAPAN |
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| 22-1 JOSUIHONCHO 5-CHOME |
| KODAIRA-SHI, TOKYO, JAPAN |
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| STANLEY P. FISHER |
| REED SMITH LLP |
| 3110 FAIRVIEW PARK DR. |
| SUITE 1400 |
| FALLS CHURCH, VA 22042 |
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Assignment:
3
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 6, KANDA SURUGADAI 4-CHOME |
| CHIYODA-KU, TOKYO, JAPAN |
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| 22-1, JOSUIHONCHO 5-CHOME |
| KODAIRA-SHI, TOKYO, JAPAN |
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| REED SMITH LLP |
| STANLEY P. FISHER |
| 3110 FAIRVIEW PARK DR. |
| FALLS CHURCH, VA 22042 |
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