Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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NONE
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Issue Dt:
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Application #:
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10951278
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Filing Dt:
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09/27/2004
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Publication #:
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Pub Dt:
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05/12/2005
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Inventors:
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Sujit Dey, Xiaoliang Bai, Li Chen, Angela Krstic
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Title:
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Method for test application and test content generation for AC faults in integrated circuits
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 1111 FRANKLIN STREET |
| 5TH FLOOR |
| OAKLAND, CALIFORNIA 94607 |
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| STEVEN P. FALLON |
| GREER, BURNS & CRAIN, LTD. |
| 300 SOUTH WACKER DRIVE |
| SUITE 2500 |
| CHICAGO, ILLINOIS 60606 |
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