Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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11/14/2006
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Application #:
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11012355
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Filing Dt:
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12/16/2004
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Publication #:
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Pub Dt:
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07/07/2005
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Inventors:
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Katsunori Hirano, Shuji Kikuchi, Yuji Sonoda, Wen Li, Tadanobu Toba, Takashi Kanesaka et al
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Title:
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SEMICONDUCTOR TESTING EQUIPMENT, TESTING METHOD FOR SEMICONDUCTOR, FABRICATION METHOD OF SEMICONDUCTOR, AND SEMICONDUCTOR MEMORY
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 6-6, MARUNOUCHI 1-CHOME |
| CHIYODA-KU, TOKYO, JAPAN |
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| 2-1, YAESU 2-CHOME |
| CHUO-KU, TOKYO, JAPAN |
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| MATTINGLY STANGER MALUR & BRUDIDGE, P.C. |
| SHRINATH MALUR |
| 1800 DIAGONAL ROAD, SUITE 370 |
| ALEXANDRIA, VA 22314 |
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