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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
Issue Dt:
02/26/2008
Application #:
11019995
Filing Dt:
12/23/2004
Publication #:
Pub Dt:
08/11/2005
Inventors:
Maki Tanaka, Chie Shishido, Yuji Takagi
Title:
METHOD OF MEASURING DIMENSIONS OF PATTERN
Assignment: 1
Reel/Frame:
017293/0462Recorded: 11/08/2005Pages: 2
Conveyance:
CORRECTED ASSIGNMENT-2ND INVENTOR'S NAME WAS SPELLED WRONG ON A PREVIOUS NOTICE OF RECORDATION
Assignors:
Exec Dt:
12/06/2004
Exec Dt:
12/17/2004
Exec Dt:
12/27/2004
Assignee:
24-14, NISHISHINBASHI 1-CHOME
MINATO-KU, TOKYO, JAPAN
Correspondent:
ANTONELLI, TERRY ET AL
1300 NORTH 17TH ST.-SUITE 1800
ARLINGTON, VA 22209
Assignment: 2
Reel/Frame:
016493/0511Recorded: 04/22/2005Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignors:
Exec Dt:
12/17/2004
Exec Dt:
12/27/2004
Exec Dt:
12/06/2004
Assignee:
24-14, NISHISHINBASHI 1 CHOME
MINATO-KU, TOKYO, JAPAN
Correspondent:
ANTONELLI, TERRY, STOUT & KRAUS, LLP
1300 NORTH 17TH STREET, SUITE 1800
ARLINGTON, VA 22209

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