Patent Assignment Abstract of Title
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Total Assignments:
2
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Patent #:
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NONE
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Issue Dt:
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Application #:
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11052908
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Filing Dt:
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02/09/2005
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Publication #:
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Pub Dt:
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08/18/2005
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Inventors:
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Yasuo Sato, Shuji Hamada, Toshiyuki Maeda, Yasuyuki Nozuyama, Atsuo Takatori
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Title:
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Circuit quality evaluation method and apparatus, circuit quality evaluation program, and medium having the program recorded thereon
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 17-2, SHIN-YOKOHAMA 3-CHOME |
| KOHOKU-KU, YOKOHAMA-SHI |
| KANAGAWA, JAPAN |
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| STAAS & HALSEY LLP |
| ATTENTION: H.J. STAAS |
| 1201 NEW YORK AVE., N.W., STE. 700 |
| WASHINGTON, D.C. 20005 |
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Assignment:
2
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 4-1, MARUNOUCHI 2-CHOME |
| CHIYODA-KU, TOKYO, JAPAN |
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| STAAS & HALSEY LLP |
| ATTENTION: H. J. STAAS |
| 1201 NEW YORK AVE., N.W., 7TH FLOOR |
| WASHINGTON, D.C. 20005 |
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