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Patent Assignment Abstract of Title
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Total Assignments: 2
Patent #:
NONE
Issue Dt:
Application #:
11023383
Filing Dt:
12/29/2004
Publication #:
Pub Dt:
08/25/2005
Inventor:
Richard Parsons
Title:
Method and apparatus for non-invasive measurement and analysis of semiconductor process parameters
Assignment: 1
Reel/Frame:
016136/0098Recorded: 04/22/2005Pages: 3
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
01/06/2005
Assignee:
3-6, AKASAKA 5-CHOME, MINATO-KU
TOKYO, JAPAN 107-8485
Correspondent:
PILLSBURY WINTHROP SHAW PITTMAN LLP
P.O. BOX 10500
1600 TYSONS BOULEVARD
MCLEAN, VA 22102
Assignment: 2
Reel/Frame:
018255/0553Recorded: 08/31/2006Pages: 14
Conveyance:
RE-RECORD TO CORRECT ASSIGNEE'S ADDRESS ON AS ASSIGNMENT DOCUMENT PREVIOUSLY RECORDED ON R/F 016136/0098
Assignor:
Exec Dt:
06/07/2006
Assignee:
3-6, AKASAKA 5-CHOME, MINATO-KU
TOKYO, JAPAN 107
Correspondent:
PILLSBURY WINTHROP SHAW PITTMAN LLP
P.O. BOX 10500
MCLEAN, VA 22102

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