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Patent Assignment Abstract of Title
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Total Assignments: 1
Patent #:
Issue Dt:
07/18/2006
Application #:
11028219
Filing Dt:
01/04/2005
Publication #:
Pub Dt:
08/25/2005
Inventor:
Yoshinori Nakayama
Title:
STANDARD REFERENCE FOR METROLOGY AND CALIBRATION METHOD OF ELECTRON-BEAM METROLOGY SYSTEM USING THE SAME
Assignment: 1
Reel/Frame:
016148/0584Recorded: 01/04/2005Pages: 2
Conveyance:
ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
Assignor:
Exec Dt:
11/19/2004
Assignee:
24-14, NISHISHINBASHI 1-CHOME
MINATO-KU, TOKYO, JAPAN
Correspondent:
ANTONELLI, TERRY, STOUT ET AL.
MELVIN KRAUS
1300 NORTH 17TH STREET, SUITE 1800
ARLINGTON, VA 22209

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