Patent Assignment Abstract of Title
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Total Assignments:
1
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Patent #:
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Issue Dt:
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10/07/2008
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Application #:
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11019109
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Filing Dt:
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12/22/2004
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Publication #:
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Pub Dt:
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09/22/2005
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Inventors:
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Atsushi Takane, Tatsuya Maeda, Takashi Iizumi
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Title:
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METHOD FOR MEASURING LINE AND SPACE PATTERN USING SCANNING ELECTRON MICROSCOPE
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Assignment:
1
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ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS).
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| 24-14, NISHI SHINBASHI 1-CHOME, MINATO-KU, |
| TOKYO, JAPAN |
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| NCDERMOTT WILL & EMERY LLP |
| 600 13TH STREET, N.W. |
| WASHINGTON, D. C. 20005-3096 |
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